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Electromigration Modeling at Circuit Layout Level
by Tan, Cher Ming.
Publication:
. IX, 103 p. 75 illus., 2 illus. in color.
Availability:
Copies available:
AUM Main Library
(1),
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Navigating Safety
by Amalberti, René.
Publication:
. XV, 132 p. 7 illus., 6 illus. in color.
Availability:
Copies available:
AUM Main Library
(1),
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Managing the Continuum: Certainty, Uncertainty, Unpredictability in Large Engineering Projects
by Caron, Franco.
Publication:
. VIII, 88 p. 13 illus.
Availability:
Copies available:
AUM Main Library
(1),
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